Atom-Probe Field Ion Microscopy

Discover the groundbreaking technique of atom-probe field ion microscopy in Tien T. Tsong's insightful book, published by Cambridge University Press in 2005. With 400 pages of comprehensive content, this essential resource delves into the only method that allows for imaging solid surfaces with atomic resolution while enabling chemical analysis of selected surface atoms from the field ion image. Tsong expertly presents the fundamental principles of this innovative technique, showcasing its remarkable capabilities in studying solid surfaces and interfaces at an atomic level. Ideal for researchers and professionals in the fields of physics and microscopy, this book is a must-have for anyone looking to deepen their understanding of advanced microscopy methods. Enhance your scientific library today with this authoritative text on atom-probe field ion microscopy.